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The Model ES62X-LVS Low Voltage Surge System, outputting lightning characteristic waveforms described in the IEC 61000-4-5, GR-1089-CORE, and C62.45-2002 standards, is designed for testing the surge immunity of devices at both wafer and package levels. Determination of ESD failure thresholds is made easy using one of the available ESD waveforms and curve tracing capabilities.
The pulse source design and pulse source delivery method ensures waveform performance directly at the device under test, not at the generator output. Current waveforms can be captured and analyzed for each ESD event. In addition, voltage waveforms can be captured and used to determine the turn-on level of protection structures. They can also be used as a means of failure determination, as the voltage waveforms show changes after pulse events.
Waveform clean and linear from 1V to 500 V
Fully isolated surge pulsing circuit
Software controlled automatic measurement
Automatic failure detection includes DC spot check and static IV
Test the surge pulse immunity for power supply, drive PCBs, communication systems, LCD display panels per IEC61000-4-5 8/20µs specification
Test the surge pulse immunity for wafer, packaged and PCB surge/OS immunity
10/1000µs test for wafer, packaged, PCB and system surge immunity
| Parameters | LVS-500-8/20 Option | LVS-500-10/1000 Option | Unit |
| Output Voltage (Open Load) | 1 – 500 | 1 – 500 | V |
| Output Current (Short Load) | 0.5 – 250 | 0.12 – 55 | A |
| Output Precision | ± 5 % | ± 5 % | % |
| Output Resistance | 2 ± 10% | 9 ± 10% | ? |
| Short Circuit Current Front Time | 8 ± 20 % | 10 – 40 % | µs |
| Short Circuit Current Time-to-Half | 20 ± 20 % | 1000 +20 % | µs |
| Open Circuit Voltage Front Time | 1.2 ± 30 % | 10 – 40 % | µs |
| Open Circuit Voltage Time-to-Half | 50 ± 20 % | 1000 +50 % | µs |
| Dimensions | 347 X 300 X 145 | mm | |
| Weight | 12 | kg | |
| Voltage Probe | Passive voltage divider probe, 101:1 | ||
| Current Probe | Passive current probe, 0.1 V/A | ||
| Line | Part # or Option # | Description |
Low Voltage Surge IV-Curve System | ||
| 1.0 | ES62X-LVS | Model ES62X-LVS Low Voltage Surge System |
| 1.1 | LVS-500-8/20 | Low Voltage Surge 8/20 Module, Max 500V |
| 1.2 | LVS-500-10/1000 | Low Voltage Surge 10/1000 us Module, Max 500V |
Additional Options | ||
| 2.1 | KSMU2400 | SMU, 200V, 1A, 20W, Single Channel (For device DC automation failure check)) |
| 2.2 | ES62X-CMPS | Compact Manual Probe Station |
| 2.3 | ES62X-XYZM-TIM | XYZ Micropositioner – Inline model, XYZ travel 500 mils with 0.01mm per step |
| 2.4 | ES62X-XYZM-PAA | PCB Probe Arm Assembly with Voltage Measurement (Type C X1, Type B X2) |
| 2.5 | ES62X-XYZM-GAA | GND Probe Arm Assembly |
| 2.6 | ES62X-XYZM-PP048 | 048 Pogopin Probing Tip |
| 2.7 | ES62X-XYZM-PP075 | 075 Pogopin Probing Tip |
| 2.8 | ES62X-XYZM-TN1 | Tungsten Needles – 5 mils Probing Tip ES62X-LVS Low Voltage Surge System |
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